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Lall, Pradeep
Pradeep Lall
Pradeep Lall
is an
electrical engineer
at
Auburn University
in Auburn, Alabama. He was named a
Fellow of the Institute of Electrical and Electronics Engineers
(IEEE) in 2012 for his contributions to
reliability prediction for electronic packaging
.
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Influence of temperature on microelectronics and system reliability : a physics of failure approach /
by
Lall, Pradeep
Published 2019
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Related Subjects
Electronic apparatus and appliances
Materials
Microelectronic packaging
Microelectronics
Reliability
TECHNOLOGY / Electricity
Thermal properties