Influence of temperature on microelectronics and system reliability : a physics of failure approach /

This book raises the level of understanding of thermal design criteria. It provides the design team with sufficient knowledge to help them evaluate device architecture trade-offs and the effects of operating temperatures. The author provides readers a sound scientific basis for system operation at r...

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Bibliographic Details
Main Author: Lall, Pradeep
Other Authors: Pecht, Michael, Hakim, Edward B.
Format: TaylorFrancis (2004-2022)
Published: Boca Raton : CRC Press, 2019.
Online Access:Taylor & Francis
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Taylor & Francis
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3rd Floor Main Library

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Call Number: A1234.567
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