Influence of temperature on microelectronics and system reliability : a physics of failure approach /
This book raises the level of understanding of thermal design criteria. It provides the design team with sufficient knowledge to help them evaluate device architecture trade-offs and the effects of operating temperatures. The author provides readers a sound scientific basis for system operation at r...
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| Other Authors: | , |
| Format: | TaylorFrancis (2004-2022) |
| Language: | English |
| Published: |
Boca Raton :
CRC Press,
2019.
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| Subjects: | |
| Online Access: | Taylor & Francis OCLC metadata license agreement |
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Taylor & FrancisOCLC metadata license agreement
3rd Floor Main Library
| Call Number: |
A1234.567 |
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| Copy 1 | Available |